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Residual stress : measurement by diffraction and interpretation / Ismail C. Noyan, Jerome B. Cohen

Auteur principal : Noyan, Ismail Cevdet, 1956-....Co-auteur : Cohen, Jerome Bernard, 1932-...., AuteurPublication :New York [etc.] : Springer, cop. 1987Description : x, 267 p : ill ; 25 cmISBN : 0-387-96378-2 ; 3-540-96378-2.Dewey: 620.1/123/0287Bibliographie: Notes bibliogr. Index.Sujet - Nom d'actualité : Contrôle non destructif ;Contraintes résiduelles -- Mesure Sujet : Méthode mesure ;Diffraction RX ;Contrainte résiduelle ;Analyse contrainte
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EMC 3564 Sur demande Bibliotheque de Corbeil EMC 3564

Introduction. Fundamental concepts in stress analysis. Analysis of residual stress fields using linear elasticity theory. Fundamental concepts in X-ray diffraction. Determination of strain and stress fields by diffraction methods. Experimental errors associated with the X-ray measurement of residual stress. The practical use of X-ray techniques. The shape of diffraction peaks - X-ray line broadening

Notes bibliogr. Index

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