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An introduction to X-ray crystallography / M.M. Woolfson

Auteur principal : Woolfson, Michael Mark, 1927-....Mention d'édition : 2nd ed.Publication : Cambridge, New York : Cambridge University Press, 1997Description : xii, 402 p. : ill. ; 26 cmISBN : 0-521-41271-4 ; 0-521-42359-7.Dewey: 548/.83Bibliographie: Includes bibliographical references (p. 397-398) and index..Sujet - Nom d'actualité : Radiocristallographie Sujet : Cristal ;Structure cristalline ;Diffraction RX ;DIFFUSION RX ;Cristallographie
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EMC 3725 Sur demande Bibliothèque de Corbeil EMC 3725

The geometry of the crystalline state. The scattering of X-rays. Diffraction from a crystal. The Fourier transform. Experimental collection of diffraction data. The factors affecting X-ray intensities. The determination of space groups. The determination of crystal structures. Accuracy and refinement processes

Includes bibliographical references (p. 397-398) and index.

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