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Scanning electron microscopy [] : physics of image formation and microanalysis / Ludwig Reimer

Auteur principal : Reimer, Ludwig, 1928-....Mention d'édition : 2nd completely rev. and updated ed.Publication : Berlin, [etc.] : Springer, cop. 1998Description : 1 vol. (XIV-457 p.) : ill. ; 24 cm.ISBN : 3-540-63976-4.Bibliographie: Bibliogr.: p. [449]-514. Index.Sujet - Nom d'actualité : Microscopie électronique à balayage ;Microanalyse par émission X Sujet : Technique ;Structure cristalline ;Rayon X ;Microscopie électronique balayage ;Microanalyse ;Matériau ;Formation image ;Diffraction ;Cathodoluminescence
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EMC 4392 Sur demande Bibliotheque de Corbeil EMC 4392

Introduction. Electron optics of a scanning electron microscope. Electron scattering and diffusion. Emission of backscattered and secondary electrons. Electron detectors and spectrometers. Image contrast and signal processing. Electron beam induced current and cathodoluminescence. Special techniques in SEM. Crystal structure analysis by diffraction. Elemental analysis and imaging with X-rays

Bibliogr.: p. [449]-514. Index

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