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Three-dimensional X-ray diffraction microscopy [] : mapping polycrystals and their dynamics / Henning F. Poulsen

Auteur principal : Poulsen, Henning F., FriisPublication : Berlin : Springer, 2004Description : 1 vol. (XI-154 p.) : ill. ; 25 cmISBN : 3-540-22330-4.Bibliographie: Notes bibliogr. Index.Sujet - Nom d'actualité : Microscopie à rayons X Sujet : Microscopie RX ;Recristallisation ;Cristallographie ;Polycristal ;Diffraction RX
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EMC 4553 Sur demande EMC 4553

Introducttion. Methods for mesoscale structural characterization. Geometric principles. GRAINDEX and related analysis. Orientation mapping. Combining 3DXRD and absorption contrast tomography. Multigrain crystallography. The 3DXRD microscope. Applications. Alternative approaches Concluding remarks

Notes bibliogr. Index

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