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1. Congrès 15th International conference on pattern recognition : proceedings : Barcelona, Spain, September 3-7, 2000, volume 4, Applications, robotics, systems and architectures / editors, A. Sanfeliu, J.J. Villanueva, M. Vanrell [et al.]Publication : Los Alamitos, California : IEEE Computer Society Press, copyright 2000Description : 1 vol. (XXIX-888 p.) : ill. ; 28 cmAvailability: Copies available for loan: Centre de Morphologie Mathématique[PL-26.4/00/MM] (1).
2. Congrès 15th International conference on pattern recognition : proceedings : Barcelona, Spain, September 3-7, 2000, volume 1, Computer vision and image analysis / editors, A. Sanfeliu, J.J. Villanueva, M. Vanrell [et al.]Publication : Los Alamitos, California : IEEE Computer Society Press, copyright 2000Description : 1 vol. (XXXI-1134 p.) : ill. ; 28 cmAvailability: Copies available for loan: Centre de Morphologie Mathématique[PL-26.1/00/MM] (1).
3. Congrès 15th International conference on pattern recognition : proceedings : Barcelona, Spain, September 3-7, 2000, volume 3, Image speech and signal processing / editors, A. Sanfeliu, J.J. Villanueva, M. Vanrell [et al.]Publication : Los Alamitos, California : IEEE Computer Society Press, cop. 2000Description : 1 vol. (XXXIII-1165 p.) : ill. ; 28 cmAvailability: Copies available for loan: Centre de Morphologie Mathématique[PL-26.3/00/MM] (1).
4. Congrès 15th International conference on pattern recognition : proceedings : Barcelona, Spain, September 3-7, 2000, volume 2, Pattern recognition and neural networks / editors, A. Sanfeliu, J.J. Villanueva, M. Vanrell [et al.]Publication : Los Alamitos, California : IEEE Computer Society Press, cop. 2000Description : 1 vol. (XXXIII-1076 p.) : ill. ; 28 cmAvailability: Copies available for loan: Centre de Morphologie Mathématique[PL-26.2/00/MM] (1).
5. Congrès Advances in Pattern Recognition and Applications : Selected papers from the Vth Spanish Symposium on Pattern Recognition and Image Analysis. 21-25 September 1992 ; editors F. Casacuberta, A. SanfeliuPublication : Singapore, River Edge, NJ, London : World scientific, 1994Description : 1 vol. (IX-264 p.) ; 22 cmAvailability: Copies available for reference: Centre de Morphologie Mathématique[PL-53/94/MM] (1).
6.  Monographies, textes Pattern recognition and image analysis : selected papers / from the 4th Spanish Symposium ; ed. by N. Perez de la Blanca, A. Sanfeliu, E. VidalPublication : Singapore, River Edge, NJ, London : World scientific, 1992Description : VIII-293 p. ; 22 cmAvailability: Copies available for reference: Centre de Morphologie Mathématique[PL-82/90/MM] (1).

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