Your search returned 5 results. Subscribe to this search

|
1. Congrès 1993 ACM SIGMETRICS Conference on Measurement and Modeling of Computer Systems : proceedings, May 10-14, 1993, Santa Clara, California, USA / @ACM SIGMETRICS Conference on Measurement and Modeling of Computer SystemsPublication :New York, N.Y. : Association for Computing Machinery, c1993Description : x, 286 p. : ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[EM AI CI200-1153] (1).
2. Congrès MEASUREMENT AND MODELING OF COMPUTER SYSTEMS.Publication :New York : ACM, 1987Description : P. 1 A 267 : X RF ; 28 CMAvailability: Copies available for reference: Centre de recherche en informatique[EM AI CI3546] (1).
3. Congrès MEASUREMENT AND MODELING OF COMPUTER SYSTEMS.Publication :1515, Broadway N.Y. 10036 : ACM, New York, 1988Description : P. 1 A 282 : X RF ; 28 CMAvailability: Copies available for reference: Centre de recherche en informatique[EM AI CI11536] (1).
4. Congrès MEASUREMENT AND MODELING OF COMPUTER SYSTEMS.Publication :1515, Broadway N.Y. 10036, New York : ACM, 1990Description : P. 1 A 282 : X RF ; 28 CMAvailability: Copies available for reference: Centre de recherche en informatique[EM AI CI6873] (1).
5. Congrès MEASUREMENT AND MODELING OF COMPUTER SYSTEMS.Publication :1515, Broadway N.Y. 10036 : ACM, New York, 1991Description : P. 1 A 227 : X RF ; 28 CMAvailability: Copies available for reference: Centre de recherche en informatique[EM AI CI200-337] (1).

Powered by Koha

//]]>