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1. Congrès 1989 ACM SIGMETRICS and Performance '89 International Conference on Measurement and Modeling of Computer Systems : proceedings, May 23-26, 1989 Berkeley, California, USA / sponsored by ACM SIGMETROCS and IFIP W.G. 7.3Publication : New York, N.Y. : Association for Computing Machinery, Baltimore, Md. : Order from ACM Order Dept., c1989Description : xi, 242 p. : ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[EM AI CI12210] (1).
2. Congrès 1995 ACM Sigmetrics Joint International Conference on Measurement and Modeling of Computer Systems : Sigmetrics '95/Performance '95 : proceedings / @Joint International Conference on Measurement and Modeling of Computer SystemsPublication : New York : ACM Press, c1995Description : xi, 330 p. : ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[EM AI CI16231] (1).
3. Congrès ACM SIGMETRICS'2000 : proceedings / International conference on measurement and modeling of computer systems, June 17-21, 2000, Santa Clara, CA USA ; sp. by ACM SIGMETRICSPublication : New York : ACM, 2000Description : XI-329 p. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[SAN 00] (1).
4. Congrès ACM SIGMETRICS 2002 [Texte imprimé] : International Conference on Measurement and Modeling of Computer Systems : proceedings, June 15-19, 2002, Marina Del Rey, California, USA / sponsored by ACM SIGMETRICSSet Level : , Performance evaluation review, v. 30, no. 1Publication : New York : Association for Computing Machinery, cop. 2002Description : X-289 p. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[MAR 02] (1).
5. Congrès ACM SIGMETRICS 2003 [Texte imprimé] : International Conference on Measurement and Modeling of Computer Systems, June 10-14, 2003, San Diego, California, USA / sponsored by ACM SIGMETRICSSet Level : , Performance evaluation review, v. 31, no. 1Publication : New York : ACM Press, cop. 2003Description : X-330 p. : ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[SAN 03] (1).
6. Congrès MEASUREMENT AND MODELING OF COMPUTER SYSTEMS.Publication : New York : ACM, 1515, Broadway N.Y. 10036, 1992Description : P. 1 A 260 : X RF ; 28 CMAvailability: Copies available for reference: Centre de recherche en informatique[EM AI CI14335] (1).
7. Congrès Proceedings : 1997 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems : June 15-18, 1997, Seattle, Washington, U.S.A / @International Conference on Measurement and Modeling of Computer SystemsPublication : New York, N.Y. : Association for Computing Machinery, c1997Description : x, 302 p. : ill. ; 29 cmAvailability: Copies available for reference: Centre de recherche en informatique[EM AI CI17473] (1).
8. Congrès Proceedings ACM SIGMETRICS '99 : International Conference on Measurement and Modeling of Computer Systems / May 1-4, 1999, Atlanta, Georgia, USAPublication : New York : Association for Computing Machinery, c1999Description : x, 237 p. : ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[ATL 99] (1).
9. Congrès SIGMETRICS '2001/PERFORMANCE '2001 Joint International Conference on Measurement and Modeling of Computer Systems : proceedings / sponsored by ACM SIGMETRICS and IFIP Working Group 7.3 ; June 16-20, 2001, Cambridge, Massachusetts, USAPublication : New York : Association for Computing Machinery, c2001Description : 347 p. : ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[CAM 01] (1).
10. Congrès SIGMETRICS 2004/Performance 2004 : joint international conference on measurement and modeling of computer systems : proceedings : june 12-16 2004, New York, New York, USA / Ed Coffman, general chairPublication : New York : ACM Press, 2004Description : X-438 p. : Ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[NEW 04] (1).
11. Congrès SIGMETRICS 2006/Performance 2006 : joint international conference on Measurement and modeling of computer systems. Proceedings. June 26-30, 2006. Saint Malo, FrancePublication : New York : ACM Press, 2006Description : 1 vol. (XVI-392 p.) : Ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[SAI 06] (1).
12. Congrès SIGMETRICS '98 /PERFORMANCE '98 Joint International Conference on Measurement and Modeling of Computer Systems : proceedings / sponsored by ACM SIGMETRICS and IFIP Working Group 7.3 ; June 22-26, 1998, Madison, Wisconsin, USAPublication : New York : Association for Computing Machinery, c1998Description : 282 p. : ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[MAD-98] (1).

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