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1. Congrès 1995 ACM Sigmetrics Joint International Conference on Measurement and Modeling of Computer Systems : Sigmetrics '95/Performance '95 : proceedings / @Joint International Conference on Measurement and Modeling of Computer SystemsPublication :New York : ACM Press, c1995Description : xi, 330 p. : ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[EM AI CI16231] (1).
2. Congrès SIGMETRICS '2001/PERFORMANCE '2001 Joint International Conference on Measurement and Modeling of Computer Systems : proceedings / sponsored by ACM SIGMETRICS and IFIP Working Group 7.3 ; June 16-20, 2001, Cambridge, Massachusetts, USAPublication :New York : Association for Computing Machinery, c2001Description : 347 p. : ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[CAM 01] (1).
3. Congrès SIGMETRICS 2004/Performance 2004 : joint international conference on measurement and modeling of computer systems : proceedings : june 12-16 2004, New York, New York, USA / Ed Coffman, general chairPublication :New York : ACM Press, 2004Description : X-438 p. : Ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[NEW 04] (1).
4. Congrès SIGMETRICS 2006/Performance 2006 : joint international conference on Measurement and modeling of computer systems. Proceedings. June 26-30, 2006. Saint Malo, FrancePublication :New York : ACM Press, 2006Description : 1 vol. (XVI-392 p.) : Ill. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[SAI 06] (1).

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