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1. Congrès Automated technology for verification and analysis [Texte imprimé] : Third international symposium, ATVA 2005, Taipei, Taiwan, October 4-7, 2005 : proceedings / Doron A. Peled, Yih-Kuen Tsay (Eds.)Publication : Berlin, New York, NY : Springer, cop. 2005Description : 1 vol. (XII-506 p.) : ill. ; 24 cmAvailability: Copies available for loan: Centre de recherche en informatique[TAI 05] (1).
2. Congrès ISSTA 2002 [Texte imprimé] : proceedings of the ACM SIGSOFT International Symposium on Software Testing and Analysis, Roma, Italy, July 22-24, 2002 / ed. by Phyllis G. FranklSet Level : , Software engineering notes, v. 27, no. 4Publication : New York, N.Y. : ACM Press, cop. 2002Description : VII-243 p. ; 28 cmAvailability: Copies available for reference: Centre de recherche en informatique[ROM 02] (1).

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