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1. Congrès Applications of electron microfractography to materials research [Texte imprimé] / a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970Publication :Philadelphia : American Society for Testing and Materials, cop. 1971Description : 1 vol. (96 p.) : ill. ; 23 cmAvailability: Copies available for reference: Bib. Evry[EMC 2267] (1).
2. Congrès Applications of modern metallographic techniques / @Symposium on Applications of Modern Metallographic TechniquesPublication :Philadelphia : American Society for Testing and Materials, [1970]Description : 272 p. : illus. ; 24 cmAvailability: Copies available for reference: Bib. Evry[EMC 2268] (1).
3.  Monographies, textes Fractography and materials science [] : a symposium / sponsored by ASTM Committee E-24 on Fracture Testing, American Society for Testing and Materials, Williamsburg, Va., 27-28 Nov. 1979 ; L.N. Gilbertson and R.D. Zipp, editorsPublication :Philadelphia, Pa., 1916 Race St., Philadelphia 19103 : ASTM, c1981Description : 449 p. : ill. ; 24 cmAvailability: Copies available for reference: Bib. Evry[EMC 2265] (1).
4. Congrès Fractography in failure analysis [Texte imprimé] : a symposium presented at may committee week, American society for testing and materials, 1-6 May 1977, Toronto, Canada / B. M. Strauss and W. H. Cullen,... editorsPublication :Description : 390 p. : ill. ; 24 cmAvailability: Copies available for reference: Bib. Evry[EMC 1882] (1).
5. Congrès Fractography of modern engineering materials [Texte imprimé] : composites and metals : a symposium [on fractography of modern engineering materials], Nashville, TN, 18-19 Nov. 1985 / John E. Masters,... and Joseph J. Au,... editorsPublication :Philadelphia, PA : ASTM, 1987Description : 1 vol. (460 p.) : ill. ; 24 cmAvailability: Copies available for reference: Bib. Evry[EMC 2781] (1).
6.  Monographies, textes Manual on electron metallography techniquesPublication :Philadelphia : American Society for Testing and Materials, [1973]Description : vi, 72 p. : illus. ; 23 cmAvailability: Copies available for loan: Sophia Antipolis[EMS 761-A02/N 161] (1). Copies available for reference: Bib. Evry[EMC 1630] (1), Sophia Antipolis[EMS 761-A02/N 161] (1).
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7. Congrès Metallography, a practical tool for correlating the structure and properties of materials : a symposium presented at the seventy-sixth annual meeting, American Society for Testing and Materials, Philadelphia, Pa., 25-26 June 1973 / Halle Abrams and G.N. Maniar, symposium cochairmen ; [Committee E-4 on Metallography sponsored the symposium]Publication :Philadelphia : The Society, 1974Description : 234 pages : illustrations ; 24 cmAvailability: Copies available for reference: Bib. Evry[EMC 1349] (1).
8. Congrès MiCon 78 : optimization of processing, properties, and service performance through microstructural control : a symposium / sponsored by ASTM Committee E-4 on Metallography, American Society for Testing and Materials, Houston, Tex., 3-5 April 1978 ; Halle Abrams... G.N. Maniar... D.A. Nail [et al.], editorsPublication :Philadelphia : The Society, c1979Description : 1 vol. (650 p.) : ill. ; 24 cmAvailability: Copies available for reference: Bib. Evry[EMC 1983] (1).
9. Congrès Microindentation techniques in materials science and engineering : a symposium sponsored by ASTM Committee E-4 on Metallography and by the International Metallographic Society, Philadelphia, PA, 15-18 July 1984 / Peter J. Blau and Brian R. Lawn, editorsPublication :Philadelphia, PA : International Metallographic Society, cop. 1985Description : 1 vol. (303 p.) : ill. ; 24 cmAvailability: Copies available for reference: Sophia Antipolis[EMS 170-A16/N 2139] (1).
10. Congrès Stereology and quantitative metallography [Texte imprimé] : a symposium presented at the seventy-fourth annual meeting, American society for testing and materials, Atlantic city, N.J., 27 june-2 july, 1971Publication :Philadelphia : American society for testing and materials, cop. 1972Description : 1 vol. (182 p.) : ill. ; 24 cmAvailability: Copies available for reference: Bib. Evry[EMC 500] (1).

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