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1.  Monographies, textes Fundamentals of surface and thin film analysis [] / Leonard C. Feldman,... James W. Mayer,...Publication : New York (N. Y.), [etc.] : North -Holland, cop. 1986Description : 1 vol. (xviii-352 p.) : ill ; 24 cmAvailability: Copies available for reference: Bib. Evry[EMC 2724] (1).
2. Congrès Methods of surface analysisPublication : Amsterdam : Elsevier, 1975Description : 481 p. ; 25 cmAvailability: Copies available for reference: Bib. Evry[EMC 3410] (1).

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