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1.  Monographies, textes Accuracy in trace analysis [] : sampling, sample handling, analysis : proceedings of the 7th materials research symposium, held at the National Bureau of Standards, Gaithersburgh, Md., october 7-11, 1974 / Philip D. Lafleur, editorPublication :Washington : U.S. Government printing office, 1976Description : 2 vol. ([XXVI]-1304 p.) : ill. en noir et en coul., fig., graph., tabl ; 24 cmAvailability: Copies available for loan: Bib. Fontainebleau[F 21859-8 (2)] (2).
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2. Congrès Energy dispersive X-ray spectrometry [Texte imprimé] : proceedings / of a Workshop on energy dispersive X-ray spectrometry held at the National bureau of standards, Gaithersburg, Md., april 23-25, 1979 ; ed. K.F.J. Heinrich, D.E. Newbury, R.L. Myklebust,.Publication :Washington : U.S. Government printing office, 1981Description : 1 vol. (VII-443 p.) : ill ; 26 cmAvailability: Copies available for reference: Bib. Evry[EMC 2183] (1).

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