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1. Congrès SPECIAL CENTENNIAL ISSUE ON STANDARDS.Publication : NEW-YORK : IEEE, 1984Description : 139 P. : RF X ; 28 CMAvailability: Copies available for reference: Centre de recherche en informatique[EM AI CI7215] (1).
2. Congrès Static analysis [ [Texte imprimé]] : 20th International symposium, SAS 2013, Seatle, WA, USA, June 20-22, 2013 : proceedings ; Francesco Logozzo, Manuel Fähndrich (eds.)Publication : Berlin, Heidelberg : Springer, cop. 2013Description : 1 vol. (X-498 p.) : fig., tabl. ; 24 cmAvailability: Copies available for reference: Bib. Fontainebleau[SEA 13] (1).
3. Congrès Verification, model checking, and abstract interpretation [ [Texte imprimé]] : 12th international conference, VMCAI 2011, Austin, TX, USA, January 23-25, 2011 : proceedings ; Ranjit Jhala, David Schmidt (eds.)Publication : Berlin, Heidelberg : Springer, cop. 2011Description : 1 vol. (XI-418 p.) ; 24 cmAvailability: Copies available for reference: Bib. Fontainebleau[AUS 11] (1).
4. Congrès Verification, model checking, and abstract interpretation [ [Texte imprimé]] : 15th international conference, VMCAI 2014, San Diego, CA, USA, January 19-21, 2014 : proceedings ; Kenneth L. McMillan, Xavier Rival (eds.)Publication : Berlin : Springer, cop. 2014Description : 1 vol. (XVII-491 p.) : ill. ; 24 cmAvailability: Copies available for reference: Bib. Fontainebleau[DIE 14] (1).

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