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1. Congrès Eighth International Congress on X-ray Optics and Microanalysis [Texte imprimé] / edited by Donald R. Beaman, Robert E. Ogilvie, and David B. WittryPublication : Midland, Mich. : Pendell Pub. Co., 1980Description : 1 vol. (xiv, 665 p.) : ill. ; 29 cmAvailability: Copies available for reference: Bib. Evry[EMC 2126] (1).
2.  Monographies, textes Electron microscopy.1980.vol.3 : AnalysisPublication : Leiden : European congress on electron microscopy foundation, 1980Description : 253 p. ; 27 cmAvailability: Copies available for reference: Bib. Evry[EMC 2146] (1).
3. Congrès Electron probe microanalysis today : practical aspects = EMAS'98 / editors : X. Llovet, C. Merlet, F. SalvatPublication : Barcelone : Universitat de Barcelona, 1998Description : 370 p. ; 30 cmAvailability: Copies available for reference: Bib. Evry[EMC 3876] (1).
4. Congrès Energy dispersion X-ray analysis [Texte imprimé] : X-ray and electron probe analysis : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 june 1970 / J. C. Russ, coordinatorPublication : Philadelphia : American Society for Testing and Materials, cop. 1971Description : 1 vol. (285 p.) : ill. ; 24 cmAvailability: Copies available for reference: Bib. Evry[EMC 1191] (1).
5. Congrès Energy dispersive X-ray spectrometry [Texte imprimé] : proceedings / of a Workshop on energy dispersive X-ray spectrometry held at the National bureau of standards, Gaithersburg, Md., april 23-25, 1979 ; ed. K.F.J. Heinrich, D.E. Newbury, R.L. Myklebust,.Publication : Washington : U.S. Government printing office, 1981Description : 1 vol. (VII-443 p.) : ill ; 26 cmAvailability: Copies available for reference: Bib. Evry[EMC 2183] (1).
6.  Monographies, textes Microanalyse par sonde électronique : spectrométrie de rayons X / D. Benoit, F. Grillon, F. MauricePublication : Orsay : Editions de Physique, 1987Description : n.p ; ? cmAvailability: Copies available for reference: Bib. Evry[EMC 2748] (3).
7.  Monographies, textes Microbeam analysis.1985Publication : San Francisco : San Francisco press, 1985Description : 383 p. ; 29 cmAvailability: Copies available for reference: Bib. Evry[EMC 2632] (1).
8.  Monographies, textes Principles of analytical electron microscopy / edited by David C. Joy, Alton D. Romig, Jr., and Joseph I. GoldsteinPublication : New York : Plenum Press, c1986Description : xvi, 448 p. : ill. ; 26 cmAvailability: Copies available for reference: Bib. Evry[EMC 2827] (1).
9.  Monographies, textes Quantitative electron-probe microanalysis / ed. V.D. Scott and G. Love,.Publication : Chichester : Ellis Horwood, New York, Brisbane, Chichester [etc.] : Halsted press, 1983Description : 345 p : ill ; 23 cmAvailability: Copies available for reference: Bib. Evry[EMC 2448] (1).

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